|  | Rabalais, J. Wayne
Principles and Applications of Ion Scattering Spectrometry
Surface Chemical and Structural Analysis
Wiley-Interscience Series on Mass Spectrometry
 1. Auflage Oktober 2002
139,- Euro
2002. 336 Seiten, Hardcover
ISBN 978-0-471-20277-6 - John Wiley & Sons
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Ion scattering spectrometry deals with critical problems that have applications in semiconductors, thin film growth, coatings, computer chips, magnetic storage devices, bioreactive surfaces, catalytic surfaces, and electrochemical surfaces. This book is written by the top name in the field with a practical applications approach.
Aus dem Inhalt
Series Preface.
Preface.
1. Introduction.
1.1. Ion Scattering Spectrometry.
1.2. Importance of Surfaces.
1.3. Survey of Ion-Surface Interactions.
1.4. Historical Development of Ion Scattering Spectrometry.
1.5. Other Types of Ion Spectrometeries.
1.6. Features of Ion Scattering Spectra.
2. Theoretical Description of Atomic Collisions.
2.1. Kinematics of Atomic Collisions.
2.2. Dynamics of Atomic Collisions.
2.3. Multiple Collisions.
Appendix 2.1. Generalized Deflection Function.
3. Experimental Methods.
3.1 General Description of an Ion Scattering Spectrometer System.
3.2. Time-of-Flight Scattering and Recoiling Spectrometer.
3.3. Coaxial Scattering Spectrometer.
3.4. Scattering and Recoiling Imaging Spectrometer.
3.5. Mass and Charge Selection of Pulsed Ion Beams Using Sequential Deflection Pulses.
3.6. Ion Scattering and Recoiling from Liquid Surfaces.
4. General Features of Ion Scattering and Recoiling Spectra.
4.1. Energy Spectra.
4.2. Time-of-Flight Spectra.
4.3. Recoiling Spectra without Scattering Spectra.
4.4. Sampling Depth.
4.5. Attributes of the Ion Scattering Technique.
4.6. Comparison to Other Surface Elemental Analysis Techniques.
5. Structural Analysis from Time-of-Flight Scattering and Recoiling Spectrometry.
5.1. Atomic Collisions in the keV Range.
5.2. Structure Analysis.
5.3. Azimuthal Alignment of the Incident Ion Beam.
5.4. TOF-SARS and LEED.
6. Real-Space Surface Crystallography from Scattering and Recoiling Imaging Spectrometry.
6.1. An Imaging Spectrometry from Nature's Own Atomic Lenses.
6.2. Shadowing and Blocking.
6.3. Azimuthal Equidistant Mapping and Projection of SARIgrams.
6.4. Simulated and Experimental SARIgrams.
6.5. Termination Layer of CdS(0001).
6.6. Chemisorption Site of Chlorine on Ni(110).
6.7. Quantitative Analysis of the Pt(111) Surface.
6.8. Direct Detection of Hydrogen Atoms on Pt(111).
6.9. Interpretation of SARIgrams.
6.10. Quantitative Analysis of SARIS Images.
6.11. Advantages of SARIS.
7. Applications of TOF-SARS and SARIS to Surface Structure Analysis.
7.1. Clean Surfaces: Reconstruction and Relaxation.
7.2. Hydrogen on Surfaces.
7.3. Oxygen on Surfaces.
7.4. Metal Oxide Surfaces.
7.5. Organic Molecules on Surfaces.
7.6. Semiconductor Surfaces.
7.7. Epilayers on Nickel.
8. Ion-Surface Charge Exchange and Inelastic Energy Losses.
8.1. Charge Exchange Processes and Interactions.
8.2. Examples of Experimental Studies-Charge Exchange Phenomena.
8.3. Theoretical Methods.
9. Hyperthermal Reactive Ion Scattering for Molecular Analysis on Surfaces.
9.1. Introduction.
9.2. Characteristic Features of Hyperthermal Ion-Surface Collisions.
9.3. Reactive Ion Scattering of Hyperthermal Cs+ Beams.
9.4. Application of the Cs+ RIS Technique.
9.5. Summary.
10. Bibliography of Ion Scattering Publications.
Index.
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