|  | Mittemeijer, E. J. / Welzel, U. (Hrsg.)
Modern Diffraction Methods
 1. Auflage Oktober 2012
139,- Euro
2012. XXVI, 528 Seiten, Hardcover
270 Abb. (25 Farbabb.), 16 Tab.
- Monographie -
ISBN 978-3-527-32279-4 - Wiley-VCH, Weinheim
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Inhalt
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Index
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| Kurzbeschreibung
The first comprehensive overview of the various applications in which these versatile and very important techniques play a major role, ranging from materials to surface science, and from nanoscience to structure determination.
Aus dem Inhalt
PREFACE
PART I: Structure Determination
STRUCTURE DETERMINATION OF SINGLE CRYSTALS
Introduction
The Electron Density
Diffraction and the Phase Problem
Fourier Cycling and Difference Fourier Maps
Statistical Properties of Diffracted Intensities
The Patterson Function
Patterson Search Methods
Direct Methods
Charge Flipping and Low-Density Elimination
Outlook and Summary
MODERN RIETVELD REFINEMENT, A PRACTICAL GUIDE
The Peak Intensity
The Peak Position
The Peak Profile
The Background
The Mathematical Procedure
Agreement Factors
Global Optimization Method of Simulated Annealing
Rigid Bodies
Introduction of Penalty Functions
Parametric Rietveld Refinement
STRUCTURE OF NANOPARTICLES FROM TOTAL SCATTERING
Introduction
Total Scattering Experiments
Structure Modeling and Refinement
Examples
Outlook
PART II: Analysis of the Microstructure
DIFFRACTION-LINE PROFILE ANALYSIS
Introduction
Instrumental Broadening
Structural Specimen Broadening
Practical Application of Line Profile Analysis
Conclusions
RESIDUAL STRESS ANALYSIS BY X-RAY DIFFRACTION METHODS
Introduction
Principles of Near-Surface X-Ray Residual Stress Analysis
Near-Surface X-Ray Residual Stress Analysis by Advanced and Complementary Methods
Final Remarks
STRESS ANALYSIS BY NEUTRON DIFFRACTION
Introductory Remarks
Fundamentals of the Technique
Instrumentation
Capabilities
Examples
TEXTURE ANALYSIS BY ADVANCED DIFFRACTION METHODS
Introduction and Background
Synchrotron X-Rays
Neutron Diffraction
Electron Diffraction
Comparison of Methods
Conclusions
SURFACE-SENSITIVE X-RAY DIFFRACTION METHODS
Introduction
X-Ray Reflectivity
Bragg Scattering in Reduced Dimensions (Crystal Truncation Rod Scattering)
Grazing Incidence X-Ray Diffraction
Experimental Geometries
Trends
THE MICRO- AND NANOSTRUCTURE OF IMPERFECT OXIDE EPITAXIAL FILMS
The Diffracted Amplitude and Intensity
The Correlation Volume
Lattice Strain
Example
Strain Gradients
Conclusions
PART III: Phase Analysis and Phase Transformations
QUANTITATIVE PHASE ANALYSIS USING THE RIETVELD METHOD
Introduction
Mathematical Basis
Applications in Minerals and Materials Research
Summary
KINETICS OF PHASE TRANSFORMATIONS AND OF OTHER TIME-DEPENDENT PROCESSES IN SOLIDS ANALYZED BY POWDER DIFFRACTION
Introduction
Kinetic Concepts
Tracing the Process Kinetics by Powder Diffraction
Mode of Measurement: In Situ versus Ex Situ Methods
Types of Kinetic Processes and Examples
Concluding Remarks
PART IV: Diffraction Methods and Instrumentation
LABORATORY INSTRUMENTATION FOR X-RAY POWDER DIFFRACTION: DEVELOPMENTS AND EXAMPLES
Introduction: Historical Sketch
Laboratory X-Ray Powder Diffraction: Instrumentation
Examples
THE CALIBRATION OF LABORATORY X-RAY DIFFRACTION EQUIPMENT USING NIST STANDARD REFERENCE MATERIALS
Introduction
The Instrument Profile Function
SRMs, Instrumentation, and Data Collection Procedures
Data Analysis Methods
Instrument Qualification and Validation
Conclusions
SYNCHROTRON DIFFRACTION: CAPABILITIES, INSTRUMENTATION, AND EXAMPLES
Introduction
The Underlying Physics of Synchrotron Sources
Diffraction Applications Exploiting High Source Brilliance
High Q-Resolution Measurements
Applications of Tunability: Resonant Scattering
Future: Ultrafast Science and Coherence
HIGH-ENERGY ELECTRON DIFFRACTION: CAPABILITIES, INSTRUMENTATION, AND EXAMPLES
Introduction
Instrumentation
Electron Diffraction Methods in the TEM
Summary and Outlook
IN SITU DIFFRACTION MEASUREMENTS: CHALLENGES, INSTRUMENTATION, AND EXAMPLES
Introduction
Instrumentation and Experimental Challenges
Examples
INDEX
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