|  | Dehm, Gerhard / Howe, James M. / Zweck, Josef (eds.)
In-situ Electron Microscopy
Applications in Physics, Chemistry and Materials Science
 1. Edition April 2012
129.- Euro
2012. XVIII, 384 Pages, Hardcover
189 Fig. (11 Colored Fig.), 4 Tab.
- Handbook/Reference Book -
ISBN 978-3-527-31973-2 - Wiley-VCH, Weinheim
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Content
Sample Chapter
Index
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| Short description
The text begins with introductory material and the basics, before going on to cover the techniques needed to determine growth processes, melting, reactions, and doping as well as mechanical, magnetic, optical and electronic properties. A final section is devoted to soft matter.
From the contents
((short))
Basics
Thermodynamics
Mechanical Properties
Magnetic Properties
Optical Properties
Electronic Properties
Ferroelectric Properties
Soft Matter
((long))
I. Basics
Scanning Electron Microscopy (SEM)
Focused Ion Beam Microscopy (FIB)
Transmission Electron Microscopy (including HRTEM and STEM)
Camera Systems for Dynamic TEM Experiments
II. Thermodynamics
Growth Processes
Melting and Pre-melting
Chemical Reactions and Oxidation
Interface Kinetcs
Formation of Silicides from a-Si and metal layers
Formation of Surface Patterns observed by Reflection Electron Microscopy
III. Mechanical Properties
The FIB Platform
Mechanical Tests in the SEM
Strain Mapping by Image Correlation (SEM to HRTEM)
Dislocation Mechanisms
New Developments: In-situ Nanoindentation, AFM, and STM Experiments in the TEM
IV. Magnetic Properties
Lorentz-Microscopy
Dynamic Observations of Domains, Vortices and of Ultrafast Phenomena by TEM and PEEM
V. Optical Properties
Cathodoluminiscence in SEM and TEM
Optical Properties of Nanotubes
VI. Electronic Properties
EBIC (SEM) and Potential Contrast
Electromigration (SEM, TEM)
VII. Ferroelectric Properties
Ferroelectric Domains
VIII. Soft Matter
Experiments using Wet-cells (SEM, ESEM, biological samples and materials)
Structure Determination of Soft Matter using In-situ Techniques
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