X-Ray Fluorescence Spectroscopy for Laboratory Applications
1. Auflage Januar 2021
520 Seiten, Hardcover
150 Abbildungen (50 Farbabbildungen)
Preis: 139,00 €
Preis inkl. MwSt, zzgl. Versand
Provides comprehensive coverage on using X-ray fluorescence for laboratory applications
This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results.
X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation.
* An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses
* Focuses on daily laboratory work with commercially available devices
* Offers a unique compilation of knowledge and best practices from equipment manufacturers and users
* Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results
X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.
Basics of X-Ray Spectrometry
Instrument Types for XRF
Acqusition and Evaluation of X-Ray Spectra
Other Element Analytical Methods
Analysis of Homogeneous Materials
Analysis of Powders
Analysis of Liquids
Trace Analysis with Total Reflection X-Ray Spectrometry
Analysis of Layer Systems
Analysis of Small Sample Areas
Determination of Element Distributions
Special Applications of XRF
Process Control and Automation
Quality Management and Method Validation
Dr. Jörg Flock is Head of the Central Laboratory of ThyssenKrupp Stahl AG and well-versed with different analytical techniques, in particular with x-ray fluorescence spectroscopy. He has extensive practical experience of using this technique for the analysis of samples with different qualities and the interpretation of the acquired results.
Dipl.-Min. Michael Haller is Chief Operating Officer of Fischer Technology Inc. in Windsor, Connecticut, USA. He obtained his Diploma degree from the University of Frankfurt, Germany, and his MSc degree from the Ohio State University, USA. He then worked at X-Ray Optical Systems Inc. before joining Fischer Technology as Technical Director in 2001.