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Books | Thin Film Analysis by X-Ray Scattering
 

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Birkholz, Mario
Thin Film Analysis by X-Ray Scattering

1. Edition October 2005
159.- Euro
2005. XXII, 356 Pages, Hardcover
175 Fig., 28 Tab. 
- Practical Approach Book -
ISBN 978-3-527-31052-4 - Wiley-VCH, Weinheim




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Short description
Emphasizing a hands-on approach, starting out from theory and leading to practical applications, the author introduces this field in a clear and precise manner.
With contributions by Paul F. Fewster and Christoph Genzel.

From the contents
Principles of X-Ray Diffraction
Identification of Chemical Phases
Line Profile Analysis
Grazing Incidence Configurations
Texture and Preferred Orientation
Residual Stress Analysis
High Resolution X-ray Diffraction

 




 

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