Kurzbeschreibung Emphasizing a hands-on approach, starting out from theory and leading to practical applications, the author introduces this field in a clear and precise manner. With contributions by Paul F. Fewster and Christoph Genzel.
Aus dem Inhalt Principles of X-Ray Diffraction Identification of Chemical Phases Line Profile Analysis Grazing Incidence Configurations Texture and Preferred Orientation Residual Stress Analysis High Resolution X-ray Diffraction
