Kurzbeschreibung This new and updated edition features a new applications section, reflecting the many breakthroughs in the field over the last years. It provides a set of computational models that describe the physical phenomena associated with atomic force microscopy and related technologies.
Aus dem Inhalt 1 Introduction 2 Uniform Cantilevers 3 Cantilever Conversion Tables 4 V-Shaped Cantilevers 5 Tip Sample Adhesion 6 Tip Sample Force Curve 7 Free Vibrations 8 Noncontact Mode 9 Tapping Mode 10 Metal-Insulator-Metal Tunneling 11 Fowler-Nordheim Tunneling 12 Scanning Tunneling Spectroscopy 13 Coulomb Blockade 14 Density of States 15 Electrostatics 16 Near-Field Optics 17 Constriction and Boundary Resistence 18 Scanning Thermal Conductivity Microscopy 19 Kelvin Probe Force Microscopy 20 Raman Scattering in Nanocrystals
