| | Contents | |
| | | |
| |
| | Volume 1 | |
| | List of Contributors XXVII | |
| 1 | Characteristics of Low-Temperature Plasmas Under Nonthermal Conditions – A Short Summary Alfred Rutscher † | 1 |
| 1.1 | Introduction | 1 |
| 1.1.1 | Definition | 1 |
| 1.1.2 | Types of Plasmas | 2 |
| 1.2 | Starting Point for Modeling the Plasma State | 2 |
| 1.2.1 | Single-Particle Trajectories | 2 |
| 1.2.2 | Kinetic and Statistical Theory | 2 |
| 1.2.3 | Hydrodynamic Approximation | 3 |
| 1.3 | The Role of Charge Carriers | 3 |
| 1.4 | Facts and Formulas | 4 |
| 1.4.1 | Electron Energy Distribution Functions (EEDF) | 4 |
| 1.4.2 | Kinetic Temperature of Electrons | 4 |
| 1.4.3 | Coefficients for Particle and Energy Transport | 5 |
| 1.4.4 | Generalized Boltzmann Equilibrium | 6 |
| 1.4.5 | Ambipolar Diffusion | 7 |
| 1.4.6 | Condition of Quasineutrality | 9 |
| 1.4.7 | Debye Screening Length | 9 |
| 1.4.8 | Degree of Ionization | 11 |
| 1.4.9 | Electrical Conductivity | 12 |
| 1.4.10 | Plasma Frequency | 14 |
| 2 | Electron Kinetics in Weakly Ionized Plasmas Detlef Loffhagen, Florian Sigeneger, and Rolf Winkler | 15 |
| 2.1 | Introduction | 15 |
| 2.1.1 | The Active Role of Electrons in the Plasma | 15 |
| 2.1.2 | Action of Electric Fields and Collision Processes | 16 |
| 2.2 | Kinetic Treatment of the Electrons | 18 |
| 2.2.1 | Velocity Distribution and Macroscopic Properties | 18 |
| 2.2.2 | Kinetic Equation of the Electrons | 19 |
| 2.2.3 | Treatment of the Kinetic Equation | 20 |
| 2.2.4 | Macroscopic Properties of the Electrons | 21 |
| 2.3 | Kinetics in Time-and Space-Independent Plasmas | 23 |
| 2.3.1 | Basic Equations and Consistent Macroscopic Balances | 23 |
| 2.3.2 | Illustration of Distribution Functions and Macroscopic Quantities | 25 |
| 2.4 | Electron Kinetics in Time-Dependent Plasmas | 28 |
| 2.4.1 | Basic Equations for the Distribution Components | 28 |
| 2.4.2 | Balance Equations and Dissipation Frequencies | 29 |
| 2.4.3 | Temporal Relaxation of the Electrons | 31 |
| 2.5 | Electron Kinetics in Space-Dependent Plasmas | 32 |
| 2.5.1 | Basic Equations and Consistent Balances | 33 |
| 2.5.2 | Spatial Relaxation of the Electrons | 34 |
| 2.6 | Electron Kinetics in Time-and Space-Dependent Plasmas | 37 |
| 2.6.1 | Basic Equations and Macroscopic Balances | 38 |
| 2.6.2 | Spatiotemporal Relaxation of the Electrons | 40 |
| 2.7 | Concluding Remarks | 43 |
| 2.7 | References | 44 |
| 3 | Elementary Collision Processes in Plasmas Kurt Becker and Chun C. Lin | 47 |
| 3.1 | Introduction | 47 |
| 3.2 | Electron-Impact-Induced Collision Processes with Atoms | 49 |
| 3.2.1 | Electron Excitation of Atoms: Overview | 49 |
| 3.2.2 | Electron Excitation Out of Metastable Levels | 50 |
| 3.2.2.1 | Argon: a Case Study | 51 |
| 3.2.2.2 | Other Rare Gases | 56 |
| 3.2.3 | Electron-Impact Ionization | 58 |
| 3.3 | Electron-Impact-Induced Collision Processes with Molecules | 61 |
| 3.4 | Concluding Remarks | 67 |
| 3.4 | References | 68 |
| 4 | Elementary Processes of Plasma–Surface Interactions Rainer Hippler | 71 |
| 4.1 | Introduction | 71 |
| 4.2 | Theoretical Considerations | 71 |
| 4.2.1 | Binary Collision Model | 72 |
| 4.2.1.1 | Scattering Angle and Energy Transfer | 72 |
| 4.2.1.2 | Stopping Power | 74 |
| 4.2.1.3 | Sputtering Yield | 77 |
| 4.2.1.4 | Computer Simulations Based on the Binary Collision Model | 78 |
| 4.2.2 | Molecular Dynamics Model | 79 |
| 4.2.3 | Scattering Potentials | 80 |
| 4.2.3.1 | Repulsive Potentials | 80 |
| 4.2.3.2 | Attractive Potentials | 81 |
| 4.3 | Scattering of Ions at Surfaces | 84 |
| 4.3.1 | Implantation of Ions | 84 |
| 4.3.2 | Backscattering of Ions | 84 |
| 4.4 | Physical Sputtering | 86 |
| 4.4.1 | Projectile Energy Dependence | 86 |
| 4.4.2 | Energy Distribution of Sputtered Particles | 87 |
| 4.4.3 | Sputtering of Clusters | 89 |
| 4.4.4 | Potential Sputtering Employing Highly Charged Ions | 89 |
| 4.5 | Electron Emission | 91 |
| 4.5.1 | Emission of Electrons by Electron Impact | 92 |
| 4.5.1.1 | Reflection of Electrons from Surfaces | 93 |
| 4.5.1.2 | Emission of Secondary Electrons by Electron Impact | 94 |
| 4.5.2 | Emission of Electrons by Ion Impact | 94 |
| 4.5.3 | Emission of Electrons by Cluster Impact | 97 |
| 4.6 | Chemical Effects | 98 |
| 4.6.1 | Chemical Sputtering and Plasma Etching | 98 |
| 4.6 | References | 100 |
| 5 | Plasma–Surface Interaction Holger Kersten and Achim von Keudell | 103 |
| 5.1 | Introduction | 103 |
| 5.2 | Elementary Mechanisms in Low-Temperature Plasma Processing | 104 |
| 5.2.1 | Adsorption | 104 |
| 5.2.1.1 | Chemisorption versus Physisorption | 104 |
| 5.2.1.2 | Sticking Coefficient and Surface Loss Probabilities | 105 |
| 5.2.1.3 | Surface Coverage | 106 |
| 5.2.1.4 | Surface Diffusion | 108 |
| 5.2.1.5 | Energy Accommodation | 109 |
| 5.2.2 | Surface Reactions | 110 |
| 5.2.3 | Quantification of Surface Reactions | 112 |
| 5.2.3.1 | Estimation of Sticking Coefficients | 112 |
| 5.2.3.2 | Measurement of Sticking Coefficients | 112 |
| 5.2.4 | Ion Bombardment in Plasma Processing | 114 |
| 5.3 | Modeling of Etching and Deposition Processes | 116 |
| 5.3.1 | Particle Balance | 117 |
| 5.3.2 | Energy Balance | 118 |
| 5.4 | Examples | 120 |
| 5.4.1 | Example: Deposition of a-Si:H Films | 120 |
| 5.4.2 | Example: Temperature Dependence of Plasma Etching | 122 |
| 5.4.3 | Example: Energy Balance During Thin Film Deposition | 124 |
| 5.4 | References | 126 |
| 6 | Fundamentals of Dusty Plasmas André Melzer and John Goree | 129 |
| 6.1 | Introduction | 129 |
| 6.2 | Particle Charging | 130 |
| 6.2.1 | Orbital-Motion Limited Theory | 130 |
| 6.2.2 | Reduction of the Charge due to High Particle Density | 133 |
| 6.2.3 | Electron Emission | 134 |
| 6.2.3.1 | Secondary Electron Emission | 135 |
| 6.2.3.2 | Photoelectric Emission | 136 |
| 6.2.4 | Ion Trapping | 136 |
| 6.2.5 | Charge Fluctuations | 137 |
| 6.3 | Forces on Particles | 137 |
| 6.3.1 | Electric Field Force | 137 |
| 6.3.2 | Gravity | 138 |
| 6.3.3 | Ion Drag Force | 138 |
| 6.3.4 | Thermophoresis | 140 |
| 6.3.5 | Neutral Drag Force | 140 |
| 6.3.6 | Radiation Pressure Forces | 141 |
| 6.3.7 | Particle Interaction Potentials | 141 |
| 6.3.7.1 | Particles in Isotropic Plasmas | 141 |
| 6.3.7.2 | Particles in the Plasma Sheath | 142 |
| 6.4 | Experimental Methods | 143 |
| 6.4.1 | Particle Confinement and Levitation | 143 |
| 6.4.1.1 | RF Discharges | 143 |
| 6.4.1.2 | DC Discharges | 145 |
| 6.4.1.3 | Discharges with Nanoparticles | 146 |
| 6.4.2 | Charge Measurement Methods | 147 |
| 6.4.2.1 | The Potential Well | 147 |
| 6.4.2.2 | Linear Resonances | 147 |
| 6.4.2.3 | Nonlinear Oscillations | 148 |
| 6.4.3 | Particle Imaging and Tracking | 149 |
| 6.5 | Strongly Coupled Systems and Plasma Crystallization | 151 |
| 6.5.1 | Phase Diagram of Charged-Particle Systems | 152 |
| 6.5.2 | Correlation Functions | 153 |
| 6.5.3 | Phase Transitions | 154 |
| 6.5.4 | Comparison to Colloids | 154 |
| 6.6 | Waves in Dusty Plasmas | 157 |
| 6.6.1 | Waves in Weakly Coupled Plasmas: Dust-Acoustic Wave (DAW) | 157 |
| 6.6.2 | Waves in Strongly Coupled Dusty Plasmas: Dust Lattice Wave | 159 |
| 6.6.2.1 | Dispersion Relations of Longitudinal and Shear Modes in | 2D |
| 6.6.2.2 | Measurements of Compressional and Shear Dust Lattice Waves | 160 |
| 6.6.2.3 | Mach Cones | 163 |
| 6.6.2.4 | Transverse Dust Lattice Waves | 164 |
| 6.6.2.5 | Natural Phonons | 164 |
| 6.6.3 | Finite Clusters and Normal Modes | 166 |
| 6.6.3.1 | 2D Clusters | 166 |
| 6.6.3.2 | 3D Clusters: Yukawa (Coulomb) Balls | 169 |
| 6.7 | Concluding Remarks | 169 |
| 6.7 | References | 170 |
| 7 | Langmuir Probe Diagnostics of Low-Temperature Plasmas Sigismund Pfau and Milan Tichý | 175 |
| 7.1 | Introduction | 175 |
| 7.1.1 | Probe Shapes and Probe Characteristics | 175 |
| 7.1.2 | The Working Regimes of the Langmuir Probe | 178 |
| 7.1.3 | Advantages and Disadvantages of Probe Diagnostics | 179 |
| 7.2 | The Langmuir Single-Probe Method | 180 |
| 7.2.1 | Theoretical Foundations of the Langmuir Probe Method | 180 |
| 7.2.2 | Probe Characteristics – Example of the Spherical Probe | 181 |
| 7.2.2.1 | Probe Current at qv Up 0 | 181 |
| 7.2.2.2 | Probe Current at qv Up 0 | 182 |
| 7.3 | General Theories of the Current to a Langmuir Probe | 183 |
| 7.3.1 | Starting System of Equations | 183 |
| 7.3.2 | The Cold Ion Model by Allen, Boyd, and Reynolds (Ti/Te =0) | 184 |
| 7.4 | The Druyvesteyn Method for Estimation of the Electron Energy Distribution Function (EEDF) | 186 |
| 7.5 | Probe Diagnostics of Anisotropic Plasmas | 190 |
| 7.6 | Probe Diagnostics Under Noncollision-Free Conditions | 192 |
| 7.7 | Langmuir Probe in a Magnetized Plasma | 197 |
| 7.8 | Space and Time-Resolved Langmuir Probe Method | 199 |
| 7.8.1 | Space-Resolved Langmuir Probe Measurements | 199 |
| 7.8.2 | Time-Resolved Langmuir Probe Measurements | 200 |
| 7.8.2.1 | Time-Resolved Probe Measurements in Periodically Changing Plasmas at < pi | 202 |
| 7.8.2.2 | Probe Measurements of Time-Averaged Plasma Parameters at pi < << pe | 202 |
| 7.8.2.3 | Time-Resolved Probe Measurements in Single-Shot Experiments | 204 |
| 7.9 | Probe Diagnostic of Chemically Active Plasmas | 204 |
| 7.10 | Double-Probe Technique | 206 |
| 7.10 | References | 208 |
| 8 | Emission and absorption spectroscopy Jürgen Röpcke, Paul B. Davies, Frank Hempel, and Boris P. Lavrov | 215 |
| 8.1 | Introduction | 215 |
| 8.2 | Instrumental Techniques | 216 |
| 8.3 | Emission Spectroscopy | 219 |
| 8.3.1 | General Considerations | 219 |
| 8.3.2 | Actinometry | 220 |
| 8.4 | Absorption Spectroscopy | 222 |
| 8.4.1 | General Considerations | 222 |
| 8.4.2 | Infrared Absorption Spectroscopy | 224 |
| 8.5 | Results and Applications: Physical Properties of Plasmas | 227 |
| 8.5.1 | Temperatures and Distribution Functions | 228 |
| 8.5.1.1 | Translational Temperature | 228 |
| 8.5.1.2 | Rotational Temperature | 229 |
| 8.5.1.3 | Vibrational Temperature | 232 |
| 8.5.2 | Degree of Dissociation | 233 |
| 8.5.3 | Electric Field, Electron Temperature, Density and Distribution Function | 235 |
| 8.5.4 | Time-Resolved Spectroscopy | 236 |
| 8.6 | Conclusions | 237 |
| 8.6 | References | 238 |
| 9 | Mass Spectrometric Diagnostics Martin Schmidt, Rüdiger Foest, and Ralf Basner | 243 |
| 9.1 | Introduction | 243 |
| 9.2 | Instrumentation | 245 |
| 9.2.1 | Ion Source | 245 |
| 9.2.2 | Mass Analyzer | 247 |
| 9.2.3 | Ion Energy Analyzer | 249 |
| 9.2.4 | Ion Detector | 250 |
| 9.3 | Coupling of the Mass Spectrometer with the Plasma System | 250 |
| 9.3.1 | Mechanical Coupling | 250 |
| 9.3.2 | Electrical Coupling | 255 |
| 9.4 | Neutral Gas Mass Spectrometry | 256 |
| 9.5 | Ion Mass Spectrometry | 261 |
| 9.6 | Mass Spectrometry for the Determination of Elementary Data for Plasma Physics | 266 |
| 9.7 | Conclusions | 267 |
| 9.7 | References | 267 |
| 10 | Cross-Correlation Emission Spectroscopy Hans-Erich Wagner, Kirill Vadimovich Kozlov, and Ronny Brandenburg | 271 |
| 10.1 | Introduction | 271 |
| 10.2 | The Technique of Cross-Correlation Spectroscopy | 272 |
| 10.3 | Investigation of Filamentary and Diffuse Barrier Discharges | 275 |
| 10.3.1 | Discharge Operation | 275 |
| 10.3.2 | Filamentary Barrier Discharges in Air | 277 |
| 10.3.3 | Systematic Variation of N2/O2 Gas Mixtures | 281 |
| 10.3.4 | Axial and Radial Development of Single Microdischarges | 282 |
| 10.3.5 | Determination of Electric Field Strength and Relative Electron Density in the Microdischarge Channel in Air | 284 |
| 10.3.5.1 | Development of E/n and ne along the MD z-axis | 284 |
| 10.3.5.2 | Axial and Radial Development of Electric Field Strength | 286 |
| 10.3.6 | Determination of Effective Lifetime Constants of States | 289 |
| 10.3.7 | Transition Between the Filamentary and Diffuse Barrier Discharges in N2/O2 Gas Mixtures | 290 |
| 10.3.8 | Filamentary and Diffuse Barrier Discharges in Noble Gas Containing Atmospheres | 292 |
| 10.3.8.1 | Diffuse Barrier Discharges in Gas Mixtures of Nitrogen with Helium, Neon, and Argon | 293 |
| 10.3.8.2 | Diffuse and Filamentary Barrier Discharges in Ne/O2 Gas Mixtures | 295 |
| 10.3.8.3 | Barrier Discharges in Pure Argon | 296 |
| 10.4 | Investigation of Corona Discharges | 298 |
| 10.4.1 | Positive Corona Discharges | 298 |
| 10.4.2 | Negative Corona Discharges | 299 |
| 10.5 | Summary | 301 |
| 10.5 | References | 302 |
| 11 | Ellipsometric Analysis of Plasma-Treated Surfaces Wolfgang Fukarek | 307 |
| 11.1 | Introduction | 307 |
| 11.2 | Comparison with Other Techniques | 308 |
| 11.3 | Experimental Technique | 309 |
| 11.3.1 | Instrumentation | 309 |
| 11.3.2 | Data Analysis | 310 |
| 11.4 | Examples | 312 |
| 11.4.1 | In situ Single Wavelength Ellipsometry Examples | 312 |
| 11.4.1.1 | Direct Current (DC) Magnetron Sputter Deposition of Indium-Tin-Oxide (ITO) Films | 313 |
| 11.4.1.2 | Temperature Dependence of a-C:H Film Growth | 313 |
| 11.4.1.3 | The Role of Low-Energy Hydrogen Ions in Plasma-Enhanced Chemical Vapor Deposition (PECVD) of Hydrocarbon Films | 315 |
| 11.4.2 | In situ Spectroscopic Ellipsometry Examples | 317 |
| 11.4.2.1 | Surface Temperature and Oxide Thickness During Argon Sputter Cleaning | 317 |
| 11.4.2.2 | Analysis of Unstable Plasma Processes | 319 |
| 11.4.2.3 | Monitoring of Ion-Beam-Assisted-Deposition Processes | 322 |
| 11.4.3 | Ex situ Spectroscopic Ellipsometry Examples | 323 |
| 11.4.3.1 | In-Plane Anisotropic Turbostratic Boron Nitride Films | 324 |
| 11.4.3.2 | Reactive Cathodic Arc Deposition of Aluminum Oxide Films | 325 |
| 11.5 | Limitations and Remaining Issues | 326 |
| 11.5 | References | 327 |
| 12 | Characterization of Thin Solid Films Harm Wulff and Hartmut Steffen | 329 |
| 12.1 | Introduction | 329 |
| 12.2 | X-Ray Methods for Thin Film Analysis | 330 |
| 12.2.1 | Grazing Incidence X-Ray Diffractometry (GIXD) | 330 |
| 12.2.2 | X-Ray Reflectometry (XR) | 333 |
| 12.3 | X-Ray Photoelectron Spectroscopy (XPS) | 335 |
| 12.4 | Examples | 336 |
| 12.4.1 | Phase Analysis of Plasma-Deposited TiNx Films | 336 |
| 12.4.2 | Characterization of Defect Structures by X-Ray Investigations | 337 |
| 12.4.2.1 | Imperfections of the First Type | 338 |
| 12.4.2.2 | Imperfections of the Second Type | 338 |
| 12.4.3 | Calculation of Depth Profiles in Plasma-Deposited Ti/TiSi Films | 341 |
| 12.4.4 | Structural Studies of Thin ITO Films | 343 |
| 12.4.5 | Investigation of Plasma-Deposited ITO Films | 347 |
| 12.4.5.1 | Influence of Oxygen Flow During Film Deposition | 348 |
| 12.4.5.2 | Influence of the Negative Substrate Voltage | 350 |
| 12.4.5.3 | Postdeposition Annealing | 351 |
| 12.4.6 | In situ Studies of Diffusion and Crystal Growth in Plasma-Deposited Thin ITO Films | 351 |
| 12.4.6.1 | Determination of Kinetic Parameters | 352 |
| 12.4.6.2 | Diffusion | 353 |
| 12.4.6.3 | Crystallization | 355 |
| 12.4.7 | Formation of Aluminum Oxide Using a Microwave-Induced Plasma | 356 |
| 12.5 | Characterization of Ag Clusters | 359 |
| 12.6 | Conclusions | 361 |
| 12.6 | References | 361 |
| 13 | Plasma Sources Martin Schmidt and Hans Conrads | 363 |
| 13.1 | Introduction | 363 |
| 13.2 | Properties of Nonthermal Plasmas | 365 |
| 13.3 | Plasma Generation by Electric Fields | 368 |
| 13.3.1 | Direct Current (dc) Discharges | 368 |
| 13.3.2 | Pulsed Direct Current (dc) Discharges | 371 |
| 13.3.3 | Radiofrequency (rf) Discharges | 372 |
| 13.3.3.1 | Capacitively Coupled Radiofrequency Discharges | 372 |
| 13.3.3.2 | Inductively Coupled Radiofrequency Discharges | 374 |
| 13.3.4 | Microwave Discharges | 376 |
| 13.4 | Plasma Generation by Beams | 379 |
| 13.5 | Conclusions | 379 |
| 13.5 | References | 381 |
| 14 | Reactive Nonthermal Plasmas Hans-Erich Wagner | 385 |
| 14.1 | Introduction | 385 |
| 14.2 | Chemical Quasiequilibria | 386 |
| 14.2.1 | The Concept | 386 |
| 14.2.2 | Chemical Quasiequilibria and the Kinetic Background | 388 |
| 14.2.3 | Experimental Verification | 391 |
| 14.3 | Plasma Chemical Similarity | 394 |
| 14.3.1 | Similarity Principles in the Chemistry of Nonthermal Plasmas | 394 |
| 14.3.2 | Application to the Flow Reactor | 396 |
| 14.3.3 | Comparison with Experimental Results | 398 |
| 14.4 | The Method of Generalized Macroscopic kinetics | 401 |
| 14.4.1 | History and Concept | 401 |
| 14.4.2 | The Particle Balance Equations | 402 |
| 14.4.3 | Demonstration Examples | 403 |
| 14.4.4 | Macroscopic Modeling of Experimental Results | 405 |
| 14.5 | Summary | 407 |
| 14.5 | References | 408 |
| | Volume 2 | |
| 15 | Atmospheric Pressure Glow Discharges Alan Garscadden | 411 |
| 15.1 | Introduction | 411 |
| 15.2 | Characteristics of the Atmospheric Pressure Glow Discharge | 412 |
| 15.3 | Near Cathode Phenomena at Atmospheric Pressure | 418 |
| 15.4 | Boundary Controlled Discharges | 421 |
| 15.5 | Glow-to-Arc Stabilization Approaches | 423 |
| 15.6 | RF Excited Glow Discharges | 427 |
| 15.7 | Microwave Excited Atmospheric Glow Discharges | 429 |
| 15.8 | Atmospheric Discharges Using Gas–Liquid Interface | 429 |
| 15.9 | Miniature Boundary Controlled Discharges | 431 |
| 15.10 | Applications | 431 |
| 15.11 | Summary and Recommendations for Future Research | 433 |
| 15.11 | References | 435 |
| 16 | High-Pressure Plasmas: Dielectric-Barrier and Corona Discharges Ulrich Kogelschatz and Jürgen Salge | 439 |
| 16.1 | Introduction | 439 |
| 16.2 | Dielectric-Barrier Discharges | 439 |
| 16.2.1 | Filamentary Discharges | 440 |
| 16.2.1.1 | Electrode Configurations and Discharge Evolution | 440 |
| 16.2.1.2 | Microdischarge Properties | 443 |
| 16.2.1.3 | Ionization, Dissociation, and Ensuing Plasma Chemistry | 443 |
| 16.2.1.4 | Discharge Control | 445 |
| 16.2.1.5 | Numerical Modeling | 446 |
| 16.2.2 | Homogeneous Discharges | 447 |
| 16.2.3 | Applications | 448 |
| 16.2.3.1 | Surface Treatment and Modification, Coating | 448 |
| 16.2.3.2 | Ozone Generation | 450 |
| 16.2.3.3 | High-Power CO2 Lasers | 452 |
| 16.2.3.4 | Excimer Lamps | 453 |
| 16.2.3.5 | Plasma Display Panels | 454 |
| 16.2.3.6 | Pollution Control | 455 |
| 16.2.3.7 | Greenhouse Gas Mitigation | 455 |
| 16.3 | Corona Discharges | 456 |
| 16.3.1 | Direct Current (dc) Discharges | 456 |
| 16.3.1.1 | Electrode Configurations, Properties, and Discharge Evolution | 456 |
| 16.3.1.2 | Current–Voltage Relations and Power Consumption | 456 |
| 16.3.1.3 | Charging and Transport of Particles and Droplets | 457 |
| 16.3.2 | Pulsed Corona Discharges | 457 |
| 16.3.3 | Applications | 458 |
| 16.3.3.1 | Electrostatic Precipitators | 458 |
| 16.3.3.2 | Pollution Control | 459 |
| 16.3 | References | 460 |
| 17 | High-Pressure Microdischarges Kurt H. Becker and Karl H. Schoenbach | 463 |
| 17.1 | Introduction | 463 |
| 17.2 | History of Microdischarges | 463 |
| 17.2.1 | The Microhollow Cathode Discharge (MHCD) | 463 |
| 17.2.2 | The Capillary Plasma Electrode Discharge | 465 |
| 17.2.3 | Microplasmas for Chemical Analysis | 466 |
| 17.2.4 | Other Microdischarges | 466 |
| 17.2.5 | The Cathode Boundary Layer Discharge | 468 |
| 17.3 | Materials and Fabrication Techniques | 469 |
| 17.4 | Diagnostics of Microplasma and Microplasma Properties | 471 |
| 17.4.1 | Modes of Microplasma Operation | 471 |
| 17.4.2 | Electron Temperature and Electron Energy Distribution | 473 |
| 17.4.3 | Electron Density | 473 |
| 17.4.4 | Gas Temperature | 474 |
| 17.4.5 | Microplasma Modeling | 474 |
| 17.5 | Applications of Microdischarges | 475 |
| 17.5.1 | Microplasmas for Environmental Applications | 475 |
| 17.5.1.1 | Destruction of Volatile Organic Compounds | 476 |
| 17.5.1.2 | Detection of Trace Contaminants | 478 |
| 17.5.2 | Biological Applications of Microplasmas | 478 |
| 17.5.3 | Microdischarges as UV Radiation Sources | 480 |
| 17.5.4 | Microdischarges as Plasma Reactors | 482 |
| 17.5.5 | Microdischarges as Plasma Cathodes | 483 |
| 17.5.6 | Microplasmas for Gas and Surface Analysis | 484 |
| 17.5.6.1 | Gas Analysis | 484 |
| 17.5.6.2 | Surface Treatment | 486 |
| 17.6 | Summary and Outlook | 487 |
| 17.6 | References | 488 |
| 18 | Materials Applications of High-Pressure Microplasmas R. Mohan Sankaran and Konstantinos P. Giapis | 495 |
| 18.1 | Introduction | 495 |
| 18.2 | Microdischarge Setup | 495 |
| 18.3 | Properties of Microplasma Sources | 497 |
| 18.3.1 | Current–Voltage Characteristics | 497 |
| 18.3.2 | Optical Emission Spectroscopy | 500 |
| 18.4 | Nonlithographic Etching of Silicon Substrates | 501 |
| 18.4.1 | Background | 501 |
| 18.4.2 | Pattern Filling: Design of a Stencil Mask | 503 |
| 18.4.3 | Etching Single Holes in Silicon | 504 |
| 18.4.4 | Etching Patterns | 508 |
| 18.5 | Thin Film Deposition | 508 |
| 18.5.1 | Background | 508 |
| 18.5.2 | Polycrystalline Diamond Films | 510 |
| 18.5.3 | Materials Characterization of Films | 512 |
| 18.6 | Continuous Flow Microreactor Synthesis of Nanoparticles | 514 |
| 18.6.1 | Background | 514 |
| 18.6.2 | Aerosol Synthesis and Characterization | 515 |
| 18.7 | Particle Charging | 517 |
| 18.7.1 | Materials Characterization of Silicon Nanoparticles | 518 |
| 18.7.2 | Photoluminescence Spectroscopy | 520 |
| 18.7 | References | 522 |
| 19 | Transient Plasma Ignition Charles Cathey and Martin Gundersen | 525 |
| 19.1 | Introduction | 525 |
| 19.2 | Streamer Motivation | 526 |
| 19.2.1 | Power Modulator Technology for Generation of Transient Plasma | 530 |
| 19.2.2 | Transient Plasma Combustion of Fuels in Constant Volume Chambers | 531 |
| 19.3 | Pulse Detonation Engine | 533 |
| 19.4 | Internal Combustion Engine Applications | 537 |
| 19.5 | Transient Plasma Ignition in High-Altitude, High-Speed Aircraft | 538 |
| 19.6 | Summary | 540 |
| 19.6 | References | 541 |
| 20 | Transient Plasma-Assisted Diesel Exhaust Remediation M. Gundersen, V. Puchkarev, A. Kharlov, G. Roth, J. Yampolsky, and D. Erwin | 543 |
| 20.1 | Introduction | 543 |
| 20.2 | Experiment | 544 |
| 20.2.1 | Diesel Exhaust Treatment | 544 |
| 20.2.2 | Laser-Induced Fluorescence (LIF) of NO/NOx | 545 |
| 20.3 | Experimental Results | 545 |
| 20.3.1 | Pulsed Power and Plasma Formation | 545 |
| 20.3.2 | Time-and Space-Resolved NO/NOx Depletion | 547 |
| 20.3.3 | Plasma Chemistry | 548 |
| 20.3.4 | Plasma-Assisted Catalyst | 549 |
| 20.4 | Summary | 549 |
| 20.4 | References | 550 |
| 21 | Plasma Display Panel Jae Koo Lee and John P. Verboncoeur | 551 |
| 21.1 | Introduction and Overview | 551 |
| 21.2 | History and Background | 552 |
| 21.3 | Alternating Current Plasma Display Panel (AC-PDP) | 552 |
| 21.3.1 | The Plasma Discharge Driven by a High Voltage | 552 |
| 21.3.1.1 | Paschen’s Law for Breakdown | 552 |
| 21.3.1.2 | Collisional Mean Free Paths | 555 |
| 21.3.2 | One-Dimensional AC-PDP Model | 555 |
| 21.3.3 | Two-Dimensional AC-PDP Models | 559 |
| 21.3.3.1 | The Matrix and the Surface Discharge AC-PDP | 559 |
| 21.3.3.2 | The Discharge Characteristics in the AC-PDP Cell | 560 |
| 21.3.4 | Driving Voltage for the AC-PDP | 562 |
| 21.3.5 | Research Status and Remaining Issues | 564 |
| 21.4 | Other PDP Types | 565 |
| 21.5 | Conclusions | 566 |
| 21.5 | References | 567 |
| 22 | Low-Pressure Discharge Light Sources Graeme Lister | 569 |
| 22.1 | Introduction | 569 |
| 22.2 | The Physics of Low-Pressure Discharge Lamps | 571 |
| 22.2.1 | Collisional Processes | 571 |
| 22.2.2 | Radiation Transport | 571 |
| 22.2.3 | Ambipolar Diffusion and Cataphoresis | 572 |
| 22.2.4 | Power Balance | 572 |
| 22.3 | Conventional (Electroded) Fluorescent Lamps | 573 |
| 22.3.1 | The Physics of Electroded Fluorescent Lamps | 573 |
| 22.3.2 | Diagnostics and Modeling of the Positive Column | 575 |
| 22.3.3 | Diagnostics and Modeling of Electrode Regions | 578 |
| 22.4 | Electrodeless Fluorescent Lamps | 579 |
| 22.4.1 | Potential Benefits of Electrodeless Discharges for Lighting | 579 |
| 22.4.2 | Electromagnetic Interference and Safety | 580 |
| 22.4.3 | The Physics of Electrodeless Fluorescent Lamps | 580 |
| 22.4.4 | Inductive Fluorescent Discharge Lamps | 580 |
| 22.4.4.1 | Reentrant Cavity Lamps | 581 |
| 22.4.4.2 | Lamps with Outer Coils | 582 |
| 22.4.4.3 | Toroidal Lamps | 582 |
| 22.4.5 | Capacitively Coupled Fluorescent Lamps | 583 |
| 22.4.6 | Surface Wave Fluorescent Discharge Lamps | 584 |
| 22.4.7 | Diagnostics and Modeling of Electrodeless Lamps | 584 |
| 22.5 | Low-Pressure Sodium Lamps | 586 |
| 22.6 | Rare Gas Discharges for Lighting | 587 |
| 22.7 | Alternatives to Mercury | 588 |
| 22.8 | Conclusions | 590 |
| 22.8 | References | 590 |
| 23 | High-Pressure Plasma Light Sources Klaus Günther | 595 |
| 23.1 | Introduction and Basic Equations | 595 |
| 23.2 | Application Demands | 597 |
| 23.2.1 | Photometric Properties | 597 |
| 23.2.2 | Operation Requirements | 599 |
| 23.2.3 | Costs and Environmental Aspects | 599 |
| 23.3 | High-Intensity Discharge (HID) Lamps and their Operational Principle | 600 |
| 23.3.1 | The Plasma of HID Lamps | 600 |
| 23.3.2 | High-Pressure Mercury (HPM) Lamps | 603 |
| 23.3.3 | Metal Halide (MH) Lamps | 604 |
| 23.3.4 | High-Pressure Sodium (HPS) Lamps | 606 |
| 23.3.5 | Technical Applications | 607 |
| 23.3.6 | New Developments | 607 |
| 23.4 | Lamp Operation | 609 |
| 23.4.1 | Starting of HID Lamps | 609 |
| 23.4.2 | Conventional Operation | 610 |
| 23.4.3 | Electronic Operation | 610 |
| 23.4.3.1 | General Considerations | 610 |
| 23.4.3.2 | Electronic Control and New Discharge Conditions | 612 |
| 23.4.3.3 | Dimming of HID Lamps | 615 |
| 23.5 | Conclusions | 616 |
| 23.5 | References | 616 |
| 24 | EUV Light Sources Larissa Juschkin, Günther Derra, and Klaus Bergmann | 619 |
| 24.1 | Introduction | 619 |
| 24.1.1 | General | 619 |
| 24.1.2 | EUV Lithography | 620 |
| 24.1.3 | EUV Light Sources | 624 |
| 24.2 | Plasmas as EUV Radiators | 625 |
| 24.3 | Laser-Produced Plasmas for EUV Generation | 632 |
| 24.3.1 | Principles and Concepts | 632 |
| 24.3.1.1 | Targets | 634 |
| 24.3.1.2 | Lasers | 634 |
| 24.3.2 | Technological Aspects and Current Status | 635 |
| 24.4 | Discharge-Produced Plasmas for EUV Generation | 635 |
| 24.4.1 | Principles and Concepts | 635 |
| 24.4.2 | Technological Aspects and Current Status | 638 |
| 24.5 | System Integration | 642 |
| 24.5.1 | Debris Mitigation | 642 |
| 24.5.2 | Collector | 645 |
| 24.6 | Outlook | 648 |
| 24.6 | References | 648 |
| 25 | Plasma Etching in Microelectronics Harald H. Richter, Steffen Marschmeyer, and André Wolff | 655 |
| 25.1 | Characterization of Plasma Etching | 655 |
| 25.2 | Etching Techniques | 657 |
| 25.2.1 | Physical Etching | 658 |
| 25.2.2 | Chemical Etching | 658 |
| 25.2.3 | Chemical–Physical Etching | 659 |
| 25.3 | Equipment-Related Topics | 660 |
| 25.4 | Etch Chemistries | 662 |
| 25.5 | Dry Etching in Advanced Technologies (Selected Examples) | 663 |
| 25.5.1 | Silicon Dry Etching | 664 |
| 25.5.1.1 | Trench Etching | 664 |
| 25.5.1.2 | Polysilicon Gate Etching | 665 |
| 25.5.2 | Oxide Etch Processes | 666 |
| 25.5.3 | Metal Etch | 667 |
| 25.6 | Process Control | 667 |
| 25.7 | Plasma-Process-Induced Damage | 669 |
| 25.7.1 | Contamination Effects | 670 |
| 25.7.2 | Charging Damage | 670 |
| 25.8 | Summary and Future Outlook | 671 |
| 25.8 | References | 672 |
| 26 | Magnetron Discharges for Thin Film Deposition Klaus Ellmer | 675 |
| 26.1 | Introduction | 675 |
| 26.2 | Brief Historical Overview | 675 |
| 26.3 | Charges in a Magnetic Field | 679 |
| 26.3.1 | Drift of Charges in Crossed E×B Fiels | 681 |
| 26.4 | Principle of a Magnetron Discharge | 682 |
| 26.5 | Types of Magnetron Discharges | 684 |
| 26.6 | Discharge Characteristics | 687 |
| 26.7 | Potential Distribution | 689 |
| 26.8 | Excitation of Magnetron Sources | 691 |
| 26.9 | Reactive Magnetron Sputtering | 693 |
| 26.10 | Self-Sputtering of Metals | 693 |
| 26.11 | Ionized Magnetron Sputtering | 694 |
| 26.12 | Magnetron Sputtering of Thin Films | 695 |
| 26.12.1 | Metallic Films | 696 |
| 26.12.2 | Oxidic Coatings | 699 |
| 26.12.3 | Semiconducting Films | 705 |
| 26.13 | Industrial Magnetron Sputtering Systems | 708 |
| 26.14 | Advantages and Limitations of Magnetron Sputtering Sources | 708 |
| 26.14 | References | 709 |
| 27 | Hollow Cathodes and Plasma Jets for Thin Film Deposition Zdenek Hubicka | 715 |
| 27.1 | Introduction | 715 |
| 27.2 | Direct Current (DC) Hollow Cathode Discharge | 715 |
| 27.3 | Radiofrequency (RF) Hollow Cathode Discharge | 720 |
| 27.4 | RF and DC Hollow Cathode Plasma Jet Systems for Low-Pressure PVD of Thin Films | 722 |
| 27.5 | DC and RF Hollow Cathode Characterization During PVD of Thin Films | 728 |
| 27.6 | Multiplasma Jet System for Coatings of Higher Surfaces and Deposition of Alloys | 730 |
| 27.7 | Deposition of ferroelectric thin films by RF-modulated plasma jet systems | 733 |
| 27.8 | Summary | 735 |
| 27.8 | References | 735 |
| 28 | Low-Temperature Plasmas for Polymer Surface Modification Jürgen Meichsner | 739 |
| 28.1 | Introduction | 739 |
| 28.2 | Low-Temperature Plasma and Plasma–Polymer Interaction | 739 |
| 28.2.1 | Characterization of Low-Pressure Electric Gas Discharges | 739 |
| 28.2.2 | Plasma Species and Expected Effects in Polymer Surface treatment | 744 |
| 28.2.3 | Methods for Characterization of Plasma-Treated Polymers | 746 |
| 28.2.4 | Polymer Samples and Thin Film Preparation | 748 |
| 28.3 | Plasma Modification of Polyethylene and Polystyrene | 749 |
| 28.4 | Plasma Modification of Wool and Cellulose Fabrics | 752 |
| 28.5 | Summary | 755 |
| 28.5 | References | 756 |
| 29 | Plasma-Enhanced Deposition of Superhard Thin Films Achim Lunk | 757 |
| 29.1 | Characterization of Superhard Materials | 757 |
| 29.2 | Plasma-Enhanced Deposition of Diamond and Diamond-Like Carbon | 759 |
| 29.2.1 | Deposition of Diamond | 760 |
| 29.2.2 | Plasma-Enhanced Deposition of Diamond-Like Carbon | 765 |
| 29.3 | Plasma-Enhanced Deposition of Cubic Boron Nitride Films | 766 |
| 29.3.1 | Physical Vapor Deposition | 769 |
| 29.3.1.1 | Ion-Beam Assisted Deposition (IBAD) | 769 |
| 29.3.1.2 | Plasma-Activated Reactive Evaporation (PARE) | 770 |
| 29.3.1.3 | Reactive Sputtering for c-BN Deposition (RST) | 773 |
| 29.3.1.4 | Plasma-Enhanced Laser Deposition | 776 |
| 29.3.2 | Plasma-Enhanced Chemical Vapor Deposition | 779 |
| 29.3.2.1 | Plasma-Enhanced Chemical Vapor Deposition in Radiofrequency (rf) Discharges | 780 |
| 29.3.2.2 | Plasma-Enhanced Chemical Vapor Deposition in ECR Discharges | 781 |
| 29.3.2.3 | Plasma-Enhanced Chemical Vapor Deposition by Direct Current (dc) Plasma Jet | 782 |
| 29.3 | References | 782 |
| 30 | Applications of Dusty Plasmas Rainer Hippler and Holger Kersten | 787 |
| 30.1 | Introduction | 787 |
| 30.2 | Particle Synthesis in Acetylene Plasmas | 788 |
| 30.3 | Coating of Powder Particles in a Combined Radiofrequency/Magnetron Discharge | 792 |
| 30.4 | Deposition of Protective Coatings onto Phosphore Particles | 794 |
| 30.5 | Formation and Deposition of Nanosize Clusters on Surfaces | 796 |
| 30.5 | References | 800 |
| 31 | Plasma-Assisted Surface Modification of Biointerfaces Andreas Ohl and Karsten Schröder | 803 |
| 31.1 | Introduction | 803 |
| 31.2 | Plasma Surface Fuctionalization for Cell Adhesion Improvement | 806 |
| 31.3 | Plasma-Induced Surface Grafting of Biomolecules | 810 |
| 31.4 | Plasma-Assisted Chemical Vapour Deposition for Coating of Biomedical Devices | 813 |
| 31.4.1 | Functional Plasma Polymer Coatings | 813 |
| 31.4.2 | Plasma-Assisted Bioceramic Coating | 816 |
| 31.5 | Conclusions | 817 |
| 31.5 | References | 817 |
| 32 | Cold-Plasma-Based Sterilization Mounir Laroussi | 821 |
| 32.1 | Introduction | 821 |
| 32.2 | Low-Pressure Studies | 822 |
| 32.3 | Cold Plasma Sources Used in Plasma-Based Sterilization | 823 |
| 32.3.1 | The Dielectric Barrier Discharge (DBD) | 823 |
| 32.3.2 | The Atmospheric Pressure Plasma Jet (APPJ)) | 824 |
| 32.3.3 | The Plasma Pencil | 825 |
| 32.4 | Kinetics of Inactivation and Inactivation Agents | 826 |
| 32.4.1 | Kinetics | 826 |
| 32.4.2 | Inactivation Agents | 829 |
| 32.4.2.1 | Heat | 829 |
| 32.4.2.2 | Charged Particles | 830 |
| 32.4.2.3 | Ultraviolet Radiation | 830 |
| 32.4.2.4 | Reactive Neutral Species | 831 |
| 32.5 | Inactivation of Biofilms | 833 |
| 32.6 | Conclusions and Prospects | 834 |
| 32.6 | References | 835 |
| 33 | Atmospheric Plasma: A Universal Tool for Physicians? Eva Stoffels | 837 |
| 33.1 | Background | 837 |
| 33.2 | How to Obtain? (Methods of Generation) | 839 |
| 33.3 | How to Apply? (Various Effects on Living Subjects) | 844 |
| 33.3.1 | Lethal Effects | 844 |
| 33.3.2 | Sublethal Effects | 849 |
| 33.3.2.1 | Cell Detachment | 855 |
| 33.3.2.2 | Apoptosis | 858 |
| 33.3.3 | Comparison with Common Means | 861 |
| 33.4 | Concluding Remarks | 862 |
| 33.4 | References | 862 |
| 34 | Markets for Plasma Technology Klaus-Dieter Weltmann, Martin Schmidt, and Kurt Becker | 865 |
| 34.1 | Introduction | 865 |
| 34.2 | Market Situation in Selected Areas | 866 |
| 34.2.1 | Plasma Light Sources | 866 |
| 34.2.2 | Environmental Applications | 867 |
| 34.2.3 | Energy Generation and Energy Saving | 869 |
| 34.2.4 | Surface Treatment Technology | 870 |
| 34.2.5 | Information Technology | 870 |
| 34.2.5.1 | Chip Production | 871 |
| 34.2.5.2 | Optical Storage Media | 871 |
| 34.2.5.3 | Flat Panel Displays | 871 |
| 34.2.6 | Mechanical Engineering | 872 |
| 34.2.7 | Medical Technique, Biotechnology, and Pharmacy | 873 |
| 34.2.8 | Textile Industry | 873 |
| 34.2.9 | Thrusters | 874 |
| 34.3 | New Markets | 874 |
| 34.4 | Conclusions | 877 |
| 34.4 | References | 878 |
| | Index | 881 |
| | | |
| | | |