|  | Iordache, Octavian
Evolvable Designs of Experiments
Applications for Circuits
 1. Auflage Januar 2009
95,90 Euro
2009. XIV, 216 Seiten, Hardcover
59 Abb. (10 Farbabb.), 90 Tab.
- Monographie -
ISBN 978-3-527-32424-8 - Wiley-VCH, Weinheim
Preis inkl. Mehrwertsteuer zzgl. Versandkosten.
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Inhalt
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Index
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Adopting a groundbreaking approach, the highly regarded author shows how to design methods for planning increasingly complex experiments and how the theories are applied in several real-life case studies from the circuit board industry.
Aus dem Inhalt
PART I: Introduction
PRINTED CIRCUITS
Technology Presentation
Inner-Layer Processing
Materials Preparation
Lamination
Drilling
Making the Hole Conductive
Imaging
Electroplating
Copper Etching
Solder Masking
Surface Finishing
Routing
Testing and Inspection
Assembling
PROBLEM SOLVING FOR RELIABILITY AND QUALITY
Conventional Paradigms
Complexity and Time Frames
Quasilinearity, Circularity, and Closure
Advance of Reliability Paradigms
PART II: Evolvable Designs of Experiments (EDOE)
POLYSTOCHASTIC MODELS
What is PSM?
Basic Notions for Categorical Frame
Illustrative Examples of PSM and Categorical Frames
FIRST-ORDER WAVE EQUATION
Algebraic Frames for Time "T" and Space "Z"
The First-Order Wave Equation
"Kinetic" Model: Walsh-Hadamard Matrices
"Convection" Model: Latin Squares
Spectral Analysis: Correlation
INFORMATIONAL ANALYSIS: EDOE MATRICES
Walsh-Hadamard Matrices and Latin Square Designs
Classification Procedures: Informational Criteria
Informational Entropy and Distances
Adaptability in Classification
Informational Results
Relation with Thermodynamics
Ranking, Discarding, and Replication of the Columns
Lumping and Splitting Columns
Juxtaposing and Cutting
Tables of DOE Matrices
EDOE METHODOLOGY
Scientific and Engineering Methods
Center Design and Hierarchy
Recursivity and Focusing
Problem-Solving Framework for PCB Quality
Forward and Backward Search
Interactions: Dissociation - Integration
EDOE Basic Steps
EDOE Frame and SKUP Schema
Comparison of EDOE with other Methods
PART III: Case Studies
SOLDER WICKING
Illustrative Failure Analysis
Illustrative EDOE Frame
SKUP Schema for Solder Wicking
RELIABILITY ANALYSIS
EDOE for Reliability
SKUP Schema for Reliability
Reliability Management Systems: Main Elements
Reliability Prediction Software
Minicoupons
Reliability Analysis
IST Electrical Resistance Analysis
DRILLING
Drilling Quality Framework
Test Coupons
Testing Small Plated Through Holes: SKUP Schema for Drilling
Reliability Tests
Lifetime Maps
Drilling Quality Evaluations
Testing the Design, D
Testing for Processing, P
Reliability Evaluations
SURFACE FINISH SOLDERABILITY
Finish Solderability Frame
SKUP Schema for Surface Finish
DIRECT PLATE
Direct Plate Reliability
Microsectioning Results
Electrical Resistance versus the Number of Cycles Classification Method
Associated Vectors-Grids
First Step of Classification
Second Step of Classification
IST Lifetime and Electroplated Cu Thickness
Summary
SKUP Schema for Direct Plate
PLATING VOIDS
Plating Voids Type
The SKUP Schema for Plating Voids
PART IV: Evolvability
SELF-ADAPTIVE CIRCUITS
Evolvability Levels
Self-Adaptivity
Self-Adaptive Designs and Constructions
Self-Adaptive Materials
Self-Adaptive Processing
Self-Adaptability to Testing and Field Conditions
PROACTIVE CIRCUITS
Proactiveness for Circuit
Evolutionary Hardware
Electrochemical Filament Circuits
EVOLVABLE CIRCUITS
Evolvability Challenges
Molecular Electronics
Bacteriorhodopsin for Optoelectronic Circuitry
Embedded Symbolic-Connectionists Hybrids
Temporal Synchrony for Embedded Symbolic-Connectionist Hybrids
Embedded EDOE
Hybrid Controlled Microfluidic Circuits
Reconfigurable Microfluidic Circuits
Self-Constructed Molecular Circuits and Computing
Genetic Code-Like Mechanism for Molecular Circuitry
Conventional Circuits versus Evolvable Circuits
EVOLVABLE MANUFACTURING SYSTEMS
Manufacturing Paradigms
Fractal Manufacturing System
Holonic Manufacturing System
Biologic Manufacturing System
Virtual Manufacturing System
SKUP Schema for Virtual Manufacturing Systems
Multiagent Manufacturing Systems: Architecture
Muiltiagent-Based Versus Conventional Manufacturing Systems
PART V: Concluding Remarks
RELATED CONCEPTS
Complexity
Evolvability
Polystochastic Method
Constructivism
Cybernetics and the Cycle of Sciences
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