Handbook of Monochromatic XPS Spectra
3 Volume Set
1. Auflage August 2000
1486 Seiten, Hardcover
Wiley & Sons Ltd
Kurzbeschreibung
Das "Handbook of Monochromatic XPS Spectra" besteht aus den drei Bänden, The Elements and Native Oxides, Semiconductors und Polymers and Polymer Damage, die hier als Set preisgünstiger angeboten werden. Diese drei Bände sind eine in sich abgeschlossene Sammlung monochromatischer XPS-Spektren in der Hand - eine unentbehrliche Hilfe im Laboralltag vieler Analytiker! Einleitende Kapitel erläutern die verwendete instrumentelle Ausrüstung, die Proben und die Verfahren der Spektrenaufnahme. Im Spektrenteil sind alle Peaks beschriftet, die Spektren sind durch umfangreiches Datenmaterial (Atom-%-Tabellen, Bindungsenergien, Halbwertsbreite usw.) ergänzt. Ein Muß für jedes XPS-Labor! (11/00)
This handbook contains an invaluable collection of research grade XPS spectra. Each handbook concentrates on a specific family of materials (the elements and their native oxides, semiconductors, and polymers) and is entirely self-contained. The introductory section to each handbook includes comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported.
Among the many valuable features included in each of these handbooks are:
* All spectra were measured by using Al_ka monochromatic X-rays.
* All spectra were collected in a self-consistent manner to maximize data reliability and quality.
* All peaks in the wide spectra are fully annotated and accompanies by detailed atom % tables that report BEs for each of the labelled peaks.
* Each high-energy resolution spectrum is peak-fitted and accompanied by detailed tables containing binding energies, FWHMs and relative percentages.
Each volume contains a 20 page introductory section giving: Instrument Details; Experimental Details; Data Processing Details; Sample Details (source of the samples. benefits and drawbacks of powdered samples being pressed into pellets); Energy Resolution Details; Energy Scale Reference Energies and Calibration Details; Electron Counting and Instrument Response Function Details; Effects of Poorly Focusing the Distance between the Sample and Electron Collection Lense; Quantitation Details and Choice of Sensitivity Exponent; Crude Tests of the Reliability of Relative Sensitivity Factors; Traceability Details; Traceability of Reference Binding Energies; Traceability Transfer from Pure Metals to Non-conductive Binary Oxides; Traceability of Relative Sensitivity Factors for Quantitation; Traceablity of Sample Purity; Reference Papers Describing the Capabilities of X-probe, M-probe and S-probe XPS systems.
Includes wide scan and high energy resolution spectra for 76 elements and the native oxides of 39 elements
Among the many valuable features included in each of these handbooks are:
* All Spectra are measured using AlK monochromatic X-rays
* All spectra are collected in a self consistent manner to maximise data reliability and quality
* All peaks in the wide spectra are fully annotated and accompanied by detailed atom % tables that report Bes for each of the labelled peaks
Each high-energy resolution spectra is peak-fitted with detailed tables containing binding energies, FWHMs and relative percentages.
