John Wiley & Sons Process Improvement in the Electronics Industry Cover A systemic approach to continuous process improvement Process improvement is rapidly becoming one o.. Product #: 978-0-471-20957-7 Regular price: $200.93 $200.93 Auf Lager

Process Improvement in the Electronics Industry

Fasser, Yefim / Brettner, Donald

Wiley Series in Systems Engineering and Management (Band Nr. 1)

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2. Auflage November 2002
648 Seiten, Hardcover
Wiley & Sons Ltd

ISBN: 978-0-471-20957-7
John Wiley & Sons

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A systemic approach to continuous process improvement

Process improvement is rapidly becoming one of the most significant
factors in achieving organizational success. Nearly every aspect of
an organization can gain from process improvement and
innovation-leadership and management, visioning and planning,
research and development, marketing and sales, manufacturing and
distribution. Emphasizing manufacturing process improvement but
covering the human side as well, Process Improvement in the
Electronics Industry, Second Edition describes a systemic approach
to continuous process improvement.

This book is based on the authors' experience in development and
implementation of a comprehensive system of continuous process
improvement and innovation at AMD. The Second Edition adds valuable
new insights and information on developments since the publication
of the highly successful previous edition. Written to serve equally
well as a comprehensive guide for engineers and technicians in
process management, and as a reference for managers in industry and
graduate students, the book explains how to develop and implement
systems for continuous process improvement in all areas of an
organization, including:

* The concepts of process improvement, process management, and
systems thinking

* Probability and statistics basics

* How to control, measure, and report on high-quality
processes

* Zero defects and the six sigma methodology

* On-line and off-line design of experiments

* Managing sampling systems in a low ppm environment

Including numerous case studies and suggestions for implementing a
process control program based on the actual experiences of
manufacturers and suppliers, Process Improvement in the Electronics
Industry, Second Edition remains a compellingly useful reference
for anyone charged with or interested in achieving greater
efficiency in industry, manufacturing, leadership, and other areas.

Preface.

Acknowledgment.

PART I: THE HUMAN SIDE OF PROCESS IMPROVEMENT.

The Concepts of Process Improvement.

Improving the Management Process.

Systems and Systems Thinking.

Creativity and Innovation.

Some Basic Concepts of Variation.

PART II: PROCESS CONTROL AND CAPABILITY STUDIES.

Some Important Probability Distributions.

Statistical Process Control.

Measurement and Inspection Capability Studies.

Process Capability Study.

Working with Skewed Distributions.

Engineering Specifications.

Zero Defects Process Capability.

Managing Sampling Systems in a Low ppm Environment.

PART III: OFF-LINE AND ON-LINE DESIGN OF EXPERIMENTS.

Off-Line Design of Experiments.

On-Line Design of Experiments.

APPENDICES.

Appendix A: The Effect of Tampering with the Process.

Appendix B: Factors for Constructing Control Charts.

Appendix C: Area Under Normal Distribution (Z Table).

Appendix D: Tables for Testing Skewness and Kurtosis.

Appendix E: Percentage Points of the F Distribution.

Appendix F: Orthogonal Arrays.

Appendix G: Omega Transformation Table.

Appendix H: Percentage Points of the t Distribution.

Appendix I: Percentage Points of the x? Distribution.

Appendix J: Cumulative Poisson Distribution.

Appendix K: Supporting Theory for the CCC Chart and the Process
Rejection Sampling Plan.

Appendix L: Value of e?-x.

Appendix M: One-Sided and Two-Sided Statistical Tolerance
Intervals.

Appendix N: A Quick Method to Design the OC and AOQ Curves for c =
0 Sampling Plans.

Appendix O: np Values for Various Confidence Intervals,
Probabilities of Acceptance, and Numbers of Nonconforming
Units.

Glossary.

Index.
"...well written and covers, in a useful fashion, an extremely wide range of relevant subjects." (Technometrics, Vol. 45, No. 4, November 2003)
YEFIM FASSER, PhD, is Director of Systems and Statistical
Engineering at Advanced Micro Devices, Inc.

DONALD BRETTNER is Group Vice President at Advanced Micro
Devices, Inc.