Handbook of Monochromatic XPS Spectra
Volume 1: The Elements and Native Oxides
1. Auflage August 2000
XXVIII, 520 Seiten, Hardcover
Wiley & Sons Ltd
Kurzbeschreibung
Das "Handbook of Monochromatic XPS Spectra" besteht aus den drei Bänden, The Elements and Native Oxides, Semiconductors und Polymers and Polymer Damage. Dies ist Band 1 "The Elements and Native Oxides" des dreibändigen Nachschlagewerkes. Die drei Bände sind eine in sich abgeschlossene Sammlung monochromatischer XPS-Spektren in der Hand - eine unentbehrliche Hilfe im Laboralltag vieler Analytiker! Einleitende Kapitel erläutern die verwendete instrumentelle Ausrüstung, die Proben und die Verfahren der Spektrenaufnahme. Im Spektrenteil sind alle Peaks beschriftet, die Spektren sind durch umfangreiches Datenmaterial (Atom-%-Tabellen, Bindungsenergien, Halbwertsbreite usw.) ergänzt. Ein Muß für jedes XPS-Labor! (11/00)
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These three volumes provide comprehensive information about the instrument, the samples, and the methods used to collect the spectra. The spectra are presented on a landscape format and cover a wide variety of elements,polymers, semiconductors, and other materials.
* Offers a clear presentation of spectra with the rightamount of experimental detail.
* All of the experiments have been conducted under controlled conditions on the same instrument by aworld-renowned expert.
Alphabetical Organization of Spectra.
Contents of Each Set of Spectra.
Philosophy of Data Collection Methods.
Peak-Fitting (Curve-Fitting) of High Energy Resolution Spectra.
Charge Compensation of Insulating Materials.
Abbreviations Used.
INSTRUMENT AND ANALYSIS DETAILS USED TO MAKE XPS DATA.
Instrument Details.
Experimental Details.
Data Processing Details.
Sample Details.
Energy Resolution Details.
Energy Scale Reference Energies and Calibration Details.
Electron Counting and Instrument Response Function Details.
Effects of Poorly Focusing the Distance between the Sample and the Electron Lens.
Quantitation Details and Choice of 'Sensitivity Exponents'.
Crude Tests of the Reliability of Relative Sensitivity Factors.
Traceability Details.
Reference Papers Describing the Capabilities of X-Probe, M-Probe, and S-Probe XPS Systems.