A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis
1. Auflage Februar 1998
XXVI, 334 Seiten, Hardcover
Wiley & Sons Ltd
Kurzbeschreibung
X-ray fluorescence (XRF) and x-ray diffraction (XRD) are analytical techniques used to identify substances by examining the amount of energy given off from a substance during an x-ray. The most common errors in XRF analysis and XRD usually occur during preparation of the specimen. This book contains the information scientists and technicians need to prepare a specimen effectively and error-free.
Das erste Buch, das die leistungsstarken Analyseinstrumente der Röntgendiffraktion und Röntgen-Fluoreszenzspektrometrie sowie auch das Präparieren von Analyseproben behandelt. Jedes Kapitel liefert detaillierte Informationen, Schritt-für-Schritt-Anleitungen und Anregungen, wo man die notwendige Ausrüstung für Probenpräparationen, Standards und Analysen findet. (10/97)
Specimen Preparation in X-Ray Fluorescence.
Specimen Preparation in X-Ray Diffraction.
Specific Areas of Specimen Preparation in X-Ray Powder Diffraction.
Special Problems in the Preparation of X-Ray Diffraction Specimens.
Specimen Preparation for Camera Methods.
Specimen Preparation Equipment.
Use of Standards in X-Ray Fluorescence Analysis.
Glossary.
Bibliography.
Index.
RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.
DEANE K. SMITH is a professor emeritus in the Department of Geosciences at Pennsylvania State University.
