John Wiley & Sons 3D Scanning for Advanced Manufacturing, Design, and Construction Cover 3D Scanning for Advanced Manufacturing, Design, and Construction Learn how 3D scanning technology d.. Product #: 978-1-119-75851-8 Regular price: $65.33 $65.33 Auf Lager

3D Scanning for Advanced Manufacturing, Design, and Construction

Confalone, Gary C. / Smits, John / Kinnare, Thomas

Additive Manufacturing Skills in Practice.

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1. Auflage Februar 2023
224 Seiten, Hardcover
Praktikerbuch

ISBN: 978-1-119-75851-8
John Wiley & Sons

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3D Scanning for Advanced Manufacturing, Design, and Construction

Learn how 3D scanning technology drives advanced manufacturing and modern construction

3D scanning technology allows non-contact scanning of objects for unprecedented data collection, analysis, and modeling. 3D models created this way are valuable at every stage of the design and build process and they have become a staple in additive manufacturing or 3D printing. As 3D printing transforms global industry at every scale, there has never been a better time for engineers and industrial professionals to be competitive in the area of 3D scanning, a multibillion-dollar market that continues to grow.

3D Scanning Technology for Advanced Manufacturing, Design, and Construction provides a comprehensive introduction to 3D scanning and its applications in both the AEC and manufacturing industries. After establishing the history and basic principles of 3D scanning, it includes discussions of the various scanner types and software interfaces, the use of 3D point clouds for analysis and reverse engineering, and much more. It covers the full range of technology and processes that engineers, architects, and manufacturing professionals use to increase accuracy and quality while reducing project timelines.

Readers of 3D Scanning Technology for Advanced Manufacturing, Design, and Construction will also find:
* Case studies that highlight techniques useful for specific real-world applications
* Comparisons of various scanning devices and software that aid in choosing the proper technologies for a specific project
* Resources and references for online learning, organizations, and certifications

Perfect for engineers, technicians, students, and industry professionals new to laser scanning, 3D Scanning Technology for Advanced Manufacturing, Design, and Construction will earn its place in libraries of technical, vocational, and continuing education audiences seeking to improve their knowledge of 3D scanning.

Gary C. Confalone, BSEE, MSME, is the CEO of ECM Global, a company specializing in 3D scanning and reverse engineering. He has spent the past three decades working in the metrology industry with the first half of his career focused on the development of laser-based measurement systems, and processes, for the aerospace industry. He has served as Chair for both the Coordinate Metrology Society and the 3D Certification Committee, and was recently awarded the American Society for Quality (ASQ) Hromi Medal. Gary received a Bachelor's degree from the University of Massachusetts, and a Master's Degree from Boston University.

John Smits, AIA, is VP of ECM, AEC Division, a registered architect, and one of the initial adopters of large volume 3D laser scanning technology as applied specifically to the architecture, engineering, and construction professions. He has shared his expertise as a speaker at trade shows, conferences, and online webinars, and authored articles in academic journals and trade magazines. John earned a Bachelor's degree in Architecture from the University of Virginia and a Master's degree in Architecture from Washington University in St. Louis.

Thomas Kinnare, BSME, is Principal Engineer and lead developer of the ECM Training Division. Over the past two decades, Tom has been instrumental in the advancement of 3D metrology practices throughout the industry, working to institute an international metrology education and certification training program. He currently serves on the American Society of Mechanical Engineers (ASME) Y14.45, GD&T Reporting Subcommittee, and the Coordinate Measurement Society Certification Committee. Tom earned his Bachelor's degree from Massachusetts Institute of Technology.