Optical Metrology
3. Edition August 2002
XII, 360 Pages, Hardcover
Wiley & Sons Ltd
Short Description
This revised edition explores the full-filed optical metrology techniques: holographic interferometry, moiré techniques, speckle methods, and photoelasticity. Also provided is an extensive treatment of Gaussian optics, light sources, detectors, and the fundamental theory and practical applications of optical metrology.
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.
Basics
Gaussian Optics
Interference
Diffraction
Light Sources and Detectors
Holography
Moire Methods, Triangulation
Speckle Methods
Photoelasticity and Polarized Light
Digital Image Processing
Fringe Analysis
Computerized Optical Processes
Fibre Optics Metrology
Appendix: Complex Numbers
Appendix: Fourier Optics
Appendix Fourier Series
Appendix The Least Squares Error Method
Appendix Semiconductor Devices