Surface Analysis with STM and AFM
Experimental and Theoretical Aspects of Image Analysis
1. Edition December 1995
XII, 323 Pages, Hardcover
233 Pictures
3 tables
Monograph
Short Description
A rational interpretation of the high-resolution features of experimentally obtained atomic scale images is essential for the application of STM and AFM for surface analysis. This book discusses the interplay between calculated surface plots and experimentally obtained images.
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Further versions
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations.
Practical examples are taken from:
* inorganic layered materials
* organic conductors
* organic adsorbates at liquid-solid interfaces
* self-assembled amphiphiles
* polymers
This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.
Theory of STM and AFM
Practical Aspects of STM and AFM Imaging
Inorganic Layered Compounds
Organic Conductors
Organic Layers on Conducting Surfaces
Other Examples and Unresolved Problems
Conclusions
